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Free Characterization Facility Workshop

The Institute of Technology Characterization Facility presents:
http://www.charfac.umn.edu/

Laboratory Demo of Analytical Probes of Polymer Adhesion and Interfaces
Thursday, January 15, 2009, 8:00 AM to 4:30 PM

UNIVERSITY OF MINNESOTA
Electrical Engineering and Computer Science (EE/CS) 3-230
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Open to IPrime member companies, invited guests, faculty and students
(For those considering IPrime membership, please Bob Lewis, lewis@cems.umn.edu, about attending these workshops free of charge as an IPrime guest.)

The Institute of Technology Characterization Facility will perform free demonstrations on CharFac instruments. Demonstration will include a subset of:


  • AFM tip-sample adhesion imaging under variable humidity and temperature
  • Microtomed samples to expose polymer-polymer interfaces
  • 3D chemical imaging with confocal Raman spectroscopy
  • Surface analytical techniques such as X-ray photoelectron spectroscopy (XPS/ESCA) and time-of-flight secondary ion mass spectrometry (ToF-SIMS)

Full Program Schedule:


  • 8:00 - 8:25 Registration

  • 8:25 - 8:30 Greg Haugstad, CharFac
    Welcome

  • 8:30 - 9:15 Sergei Magonov, Agilent Technologies
    AFM: Introduction and local electrical property characterization

  • 9:15 - 9:40 Greg Haugstad, CharFac
    Environmental pulsed force mode AFM

  • 9:40 - 9:55 Break

  • 9:55 - 10:40 Kevin Kjoller, Anasys Instruments
    Heated Tip AFM

  • 10:40 - 11:05 Jinping Dong, CharFac
    Confocal Raman microscopy

  • 11:05 - 11:30 John Thomas, CharFac
    X-ray photoelectron spectroscopy

  • 11:30 - 12:30 Lunch
    (box lunch provided for industrial members and guests, speakers and faculty)

  • 12:30 - 4:30 Rotating Demonstrations
    Four stations: two AFM, confocal Raman, XPS
    45 minute demos per station x 4, freelance during the last hour

Printable Lab Demo Schedule

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