The Institute of Technology Characterization Facility presents:
http://www.charfac.umn.edu/
Laboratory Demo of Analytical Probes of Polymer Adhesion and Interfaces
Thursday, January 15, 2009, 8:00 AM to 4:30 PM
UNIVERSITY OF MINNESOTA
Electrical Engineering and Computer Science (EE/CS) 3-230
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Open to IPrime member companies, invited guests, faculty and students (For those considering IPrime membership, please Bob Lewis, lewis@cems.umn.edu, about attending these workshops free of charge as an IPrime guest.)
The Institute of Technology Characterization Facility will perform free demonstrations on CharFac instruments. Demonstration will include a subset of:
- AFM tip-sample adhesion imaging under variable humidity and temperature
- Microtomed samples to expose polymer-polymer interfaces
- 3D chemical imaging with confocal Raman spectroscopy
- Surface analytical techniques such as X-ray photoelectron spectroscopy (XPS/ESCA) and time-of-flight secondary ion mass spectrometry (ToF-SIMS)
Full Program Schedule:
- 8:00 - 8:25 Registration
- 8:25 - 8:30 Greg Haugstad, CharFac
Welcome - 8:30 - 9:15 Sergei Magonov, Agilent Technologies
AFM: Introduction and local electrical property characterization
- 9:15 - 9:40 Greg Haugstad, CharFac
Environmental pulsed force mode AFM - 9:40 - 9:55 Break
- 9:55 - 10:40 Kevin Kjoller, Anasys Instruments
Heated Tip AFM - 10:40 - 11:05 Jinping Dong, CharFac
Confocal Raman microscopy - 11:05 - 11:30 John Thomas, CharFac
X-ray photoelectron spectroscopy - 11:30 - 12:30 Lunch
(box lunch provided for industrial members and guests, speakers and faculty) - 12:30 - 4:30 Rotating Demonstrations
Four stations: two AFM, confocal Raman, XPS
45 minute demos per station x 4, freelance during the last hour
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