IPrime, the Institute of Technology's Characterization Facility, the University of Minnesota, and several instrument suppliers are pleased to present the following free workshop.
Surface and Thin Film Characterization
December 9-10, 2009
8:30 a.m.-5 p.m.
University of Minnesota
Coffman Memorial Union Theater
300 Washington Avenue SE, Minneapolis, MN 55455-0110
In-depth characterization of properties of surfaces and thin films, essential in many areas of materials research as well as device and process development, may be improved by using a combination of techniques. Film thickness and optical properties (ellipsometry), surface free energy (contact angle), surface morphology (SPM/AFM), and surface/thin film chemical composition (RBS and TOF SIMS) are a few measurements that may be used to describe a surface, thin film, material and/or device. The suite of the instrumentation featured in this workshop provides complementary information as is often needed by our academic and industrial users. This workshop is a great opportunity for those who want to learn basic principles and see state-of-the-art instrumentation in action. A brief description of each technique is given in the workshop announcement.
The workshop is free of charge, but registration is required. To register, please fill out the registration form and email it to email@example.com or fax to (612) 625-5368. Please indicate in the registration form which instruments you would like to see during the demo, and whether you will bring samples to the workshop to be analyzed. Detailed descriptions of the samples are also needed.
For more information, please contact Dr. Jinping Dong from the University's Characterization Facility at firstname.lastname@example.org or 612-625-1841.
We hope you will join us for this workshop.