IPrime, the University of Minnesota's Characterization Facility, and workshop sponsors and instrument suppliers - Agilent, Hysitron (both IPrime members), and Veeco - are pleased to present a two day workshop on Nanomechanical Mapping.
The workshop includes a seminar and instrument demo covering an introduction to advanced modes of scanning probe microscopy (SPM or AFM) and nanoindentation. It provides a great opportunity for those who want to learn basic principles and see state-of-the-art instrumentation in action.
October 26, 2010 - Seminar 1 - 4 pm
October 27, 2010 - Instrument Demo 9 am - 5 pm
University of Minnesota, Minneapolis Campus
This workshop and demo introduces the principles of nanomechanical measurement and imaging modes, applied to a broad range of material types ranging from very hard (GPa) to very soft (kPa).
The advanced capabilities and ease of use of modern instrumentation systems will be highlighted, with emphasis on new imaging modes and environmental control. In the process some newer applications will be demonstrated; in some cases this will be augmented by attendee sample analysis.
Full Program PDF - Please distribute
Complete information and locations
The workshop is free, but registration is required. To register, email your detailed contact information to firstname.lastname@example.org. You may bring samples to the demo. Please include a description of the samples in your registration email.
Contact Dr. Jinping Dong at 612-625-1841.