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Campbell, SA -- Electrical and Computer Engineering

Campbell contact info;
Authors:
Zhang, ZH; Li, M; *Campbell, SA*; 
Title:
A study on charge reduction in HfO2 gate stacks
Source:
IEEE TRANSACTIONS ON ELECTRON DEVICES 52 (8): 1839-1844 2005
ISSN:
0018-9383
find it

Posted by U of M Lib Science and Engineering Lib on April 30, 2006 03:43 PM |

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