Frisbie, CD -- Chemical Engineering and Materials Science
Frisbie contact info;
Authors:
Engelkes, VB; Beebe, JM; *Frisbie, CD*; 
Title:
Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conducting-probe atomic force microscopy
Source:
JOURNAL OF PHYSICAL CHEMISTRY B 109 (35): 16801-16810 2005
ISSN:
1520-6106

Authors:
Engelkes, VB; Beebe, JM; *Frisbie, CD*; 
Title:
Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conducting-probe atomic force microscopy
Source:
JOURNAL OF PHYSICAL CHEMISTRY B 109 (35): 16801-16810 2005
ISSN:
1520-6106