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Frisbie, CD -- Chemical Engineering and Materials Science

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Authors:
Engelkes, VB; Beebe, JM; *Frisbie, CD*
Title:
Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conducting-probe atomic force microscopy
Source:
JOURNAL OF PHYSICAL CHEMISTRY B 109 (35): 16801-16810 2005
ISSN:
1520-6106
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