Campbell, SA -- Electrical and Computer Engineering
Campbell contact info;
Authors:
Zhang, Z; Li, M; *Campbell, SA*; 
Title:
Effects of annealing on charge in HfO2 gate stacks
Source:
IEEE ELECTRON DEVICE LETTERS 26 (1): 20-22 2005
ISSN:
0741-3106

Authors:
Zhang, Z; Li, M; *Campbell, SA*; 
Title:
Effects of annealing on charge in HfO2 gate stacks
Source:
IEEE ELECTRON DEVICE LETTERS 26 (1): 20-22 2005
ISSN:
0741-3106