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Frisbie, CD -- Chemical Engineering and Materials Science

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Authors:
Pesavento, PV; Chesterfield, RJ; Newman, CR; *Frisbie, CD*
Title:
Gated four-probe measurements on pentacene thin-film transistors: Contact resistance as a function of gate voltage and temperature
Source:
JOURNAL OF APPLIED PHYSICS 96 (12): 7312-7324 2004
ISSN:
0021-8979
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